EXTECH SDL470-NIST UV light radiation measuring device (20mW / cm2, data logging, NIST)

Specifications:

Range: 

          UVA : 2mW / cm2, 20mW / cm2

                 Max Resolution:   0.001mW / cm2

                 Basic Accuracy:   ± 4% FS  

          UVC : 2mW / cm2, 20mW / cm2

                Max Resolution:   0.001mW / cm2

             Basic Accuracy:   ± 4% FS

Frequency Bandwidth:  365nm (UVA); 254nm (UVC)

Type K Temperature:       -148 to 2372 ° F (-100 to 1300 ° C)

         Max Resolution:   0.1 ° F / ° C

         Basic Accuracy:   ± (0,4% ± 1,8 ° F / 1 ° C)

Type J Temperature J:        -148 to 2192 ° F (-100 to 1200 ° C)

         Max Resolution:   0.1 ° F / ° C

         Basic Accuracy:   ± (0,4% ± 1,8 ° F / 1 ° C)

Memory: 20M data records using 2GB SD card 

Dimensions/ Weight: 7.2 x 2.9 x 1.9" (182 x 73 x 47.5mm)/ 16.2oz (475g)